Invited speakers

 

Prof. Robert Hadfield, Head of Division of Electronic and Nanoscale Engineering, School of Engineering, University of Glasgow, U.K.

Prof. Akira Fujimaki, Quantum Engineering, Nagoya University, Japan

Dr. Robert Romanofsky, NASA Glenn Research Center, USA.

Dr. Jan Herrmann, General Manager, Physical Metrology, National Measurement Institute, Australia.

 

Invited speakers:

Dr. Ronny Stolz, IPHT-Jena, Germany

Prof. Lixing You, SIMIT, China

Prof. Jian Chen, Nanjing, China

Prof. Tim Duty, University of New South Wales, Australia

Prof. Dag Winkler, Chalmers, Sweden

Prof. Yong-Hamb Kim, Korea Research Institute of Standards and Science, Korea

Prof. Huabing Wang, Nanjing University, China

Dr. Shane Keenan, CSIRO, Australia

Dr. Jia Du, CSIRO, Australia

Dr. Hiroyuki Shibata, Kitami Institute of Technology, Japan

Dr. Emma Mitchell, CSIRO, Australia

Dr. Bob Fagaly, Honeywell Inc., USA

Dr. Paul Sowman, Macquarie University, Australia